| 摘要 |
PROBLEM TO BE SOLVED: To reduce an inspecting time of a semiconductor device with a plurality of semiconductor storage devices mounted thereon. SOLUTION: The semiconductor device with the plurality of semiconductor storage devices mounted thereon for using test input data for inspection having a bit length of the divided data bit width, and the inspecting method thereof are constituted so that memory selection signals can be enabled for the all of the semiconductor storage devices or the arbitrary plurality of semiconductor storage devices, to write the plurality of semiconductor storage device simultaneously by one write operation. Further, test output data having the bit length of the divided data bit width, are read out simultaneously from the plurality of semiconductor storage devices to decide the quality by comparing these data. By such constitution, the time required for reading/writing the test data is shortened, and the inspecting time of the semiconductor device is reduced. COPYRIGHT: (C)2008,JPO&INPIT
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