发明名称 Burst access memory with zero wait states
摘要 A memory device has a segmented memory cell array that take a row address and a column address and allows for data words in a column page to be read internally in parallel for faster access. The memory device employs a segmented memory array that routes column address and column address+1 to the segments. This allows for a random starting data word in the column page, while the data words in the next column page (column address+1) are loaded into the memory array segments before the starting data word. When the data page mode or linear burst access crosses a column address boundary the next data words in column address+1 are available and no wait states need to be asserted to allow for new column address values to propagate.
申请公布号 US6477082(B2) 申请公布日期 2002.11.05
申请号 US20000751688 申请日期 2000.12.29
申请人 MICRON TECHNOLOGY, INC. 发明人 PEKNY THEODORE T.;GUALANDRI STEPHEN J.
分类号 G11C7/10;G11C8/12;G11C16/08;(IPC1-7):G11C11/34 主分类号 G11C7/10
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