发明名称 |
APPARATUS FOR ANALYZING ELECTRICAL CHARACTERISTIC OF MATERIAL COATED WITH METAL-CONTAINING COATING MATERIAL |
摘要 |
<p>Provided is an electrical characteristic analyzing apparatus which can easily analyze electrical characteristics of a material coated with a metal-containing coating material in a short time. An electrical characteristic analyzing apparatus (100) is provided with an analysis model acquiring means (101) for acquiring analysis model information; a wave source information acquiring means (102) for acquiring wave source information; a property value acquiring means (103) for acquiring property values relating to the analysis model; and an electromagnetic field analyzing means (104) for analyzing electrical characteristics at an observation point, corresponding to an electrical or magnetic signal given from the wave source.</p> |
申请公布号 |
WO2008105177(A1) |
申请公布日期 |
2008.09.04 |
申请号 |
WO2008JP00364 |
申请日期 |
2008.02.27 |
申请人 |
FUJITSU LIMITED;NAGASE, KENJI |
发明人 |
NAGASE, KENJI |
分类号 |
G01N27/72;G01N27/00;G01R29/08 |
主分类号 |
G01N27/72 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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