发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To make a device capable of withstanding high voltage by making a buffer layer high resistance without increasing threshold voltage. SOLUTION: A field effect transistor 100 includes on a substrate 1 buffer layers 2, 3, a semiconductor working layer 4, a gate insulating film 5Ga, and a gate electrode 5Gb by laminating them sequentially, wherein in the buffer layer 3, the dislocation density within a predetermined plane in parallel to the laminated plane of this buffer layer 3 is made to be a density value at which the volume resistivity of the buffer layer 3 to this dislocation density becomes close to the maximal value, to be more precise, it is made to be 2.0×10<SP>8</SP>cm<SP>-2</SP>or more, 7.0×10<SP>10</SP>cm<SP>-2</SP>or less. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008205221(A) 申请公布日期 2008.09.04
申请号 JP20070039956 申请日期 2007.02.20
申请人 FURUKAWA ELECTRIC CO LTD:THE 发明人 SATO YOSHIHIRO;KATOU SADAHIRO
分类号 H01L29/78;H01L21/20;H01L29/786 主分类号 H01L29/78
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