发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To raise a threshold voltage in an n-type SOI-MOSFET without inducing a substrate floating effect, and also to prevent the deterioration of throughput in manufacturing. SOLUTION: P-type impurities for determining the conductive type of a channel region in an SOI substrate 11 and fluorine are introduced to a channel formation planned region 23. In this case, fluorine is introduced by a low-acceleration voltage, that is, it is introduced shallowly from the upper surface of the channel formation planned region. Heat treatment is performed after introducing the p-type impurities and the fluorine. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008205031(A) 申请公布日期 2008.09.04
申请号 JP20070036721 申请日期 2007.02.16
申请人 OKI ELECTRIC IND CO LTD 发明人 DOMAE YASUHIRO
分类号 H01L29/786 主分类号 H01L29/786
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