发明名称 SUBSTRATE PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To prevent reduction of a throughput by shortening the purge time. SOLUTION: A substrate processing apparatus includes a nozzle 300 for supplying a processing gas to form a desired film on a surface of the substrate. The nozzle 300 has a double pipe structure of a center pipe 320 and an outer peripheral pipe 310, the processing gas is supplied into a gap between the center pipe 320 and the outer peripheral pipe 310, and a purge gas is supplied to the center pipe 320. The outer peripheral pipe 310 has at least one gas supply hole 312 open to the substrate, and the center pipe 320 has at least two gas supply holes 322 and 324. The gas supply hole 312 is located at a position between the gas supply holes 322 and 324 in a substrate lamination direction. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008205151(A) 申请公布日期 2008.09.04
申请号 JP20070038982 申请日期 2007.02.20
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 SUDA ATSUHIKO
分类号 H01L21/31;C23C16/455 主分类号 H01L21/31
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