发明名称 DESIGN STRUCTURE FOR ENHANCING YIELD AND PERFORMANCE OF CMOS IMAGING SENSORS
摘要 A design structure for replacing a defective pixels in a pixel array is presented. The design structure includes means for identifying a defective pixel in the pixel array, means for generating a code including information corresponding to the defective pixel row and column; means for decoding the information; and means for generating a signal that permanently identifies the defective pixel row and column based on the decoded information. The design structure further includes means for substituting data from the defective pixel with data from a functioning pixel disposed in a same row as, and next to, the defective pixel based on the generated signal.
申请公布号 US2008215261(A1) 申请公布日期 2008.09.04
申请号 US20080117172 申请日期 2008.05.08
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ABADEER WAGDI W.
分类号 G01R31/3181 主分类号 G01R31/3181
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