| 发明名称 |
METHOD AND SYSTEM OF USING INFERENTIAL MEASUREMENTS FOR ABNORMAL EVENT DETECTION IN CONTINUOUS INDUSTRIAL PROCESSES |
| 摘要 |
<p>The present invention is a method and system for detecting an abnormal on-line analysis or laboratory measurement and for predicting an abnormal quality excursion due to an abnormal process condition.</p> |
| 申请公布号 |
WO2008106071(A1) |
申请公布日期 |
2008.09.04 |
| 申请号 |
WO2008US02428 |
申请日期 |
2008.02.25 |
| 申请人 |
EXXONMOBIL RESEARCH AND ENGINEERING COMPANY;EMIGHOLZ, KENNETH, F. |
发明人 |
EMIGHOLZ, KENNETH, F. |
| 分类号 |
G05B13/02 |
主分类号 |
G05B13/02 |
| 代理机构 |
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