发明名称 |
Method for manufacturing semiconductor element, involves implanting ions of doped material with large diffusion coefficients in semiconductor and irradiating multiple pulsed laser radiation using multiple laser irradiation devices |
摘要 |
<p>The method involves implanting ions of a doped material with a large diffusion coefficients in a semiconductor and irradiating multiple pulsed laser radiation using multiple laser irradiation devices during activating a doped layer, in which the doped material is implanted, on a single doped layer or successive layers. The successive layers are formed from multiple doped layers with the same conductor type or with different conductor type.</p> |
申请公布号 |
DE102008003953(A1) |
申请公布日期 |
2008.09.04 |
申请号 |
DE20081003953 |
申请日期 |
2008.01.11 |
申请人 |
FUJI ELECTRIC DEVICE TECHNOLOGY CO. LTD. |
发明人 |
NAKAZAWA, HARUO |
分类号 |
H01L21/265;H01L21/268;H01L21/33 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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