发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To obtain a low on-resistance (Ron×A) in a lateral MOSFET formed in a p-well region of an n-type semiconductor layer. SOLUTION: Between an n-offset region 9 and an n<SP>+</SP>-source region 4, a surface exposed part of an n-well region 2 separated from a p-well region 3 is prepared, and a gate electrode 7 is formed on the surface from the n-offset region 9 to the n<SP>+</SP>-source region 4. In this case, both the n-offset 9 and the n-well region 2 can be made into current passages. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008205494(A) 申请公布日期 2008.09.04
申请号 JP20080098836 申请日期 2008.04.07
申请人 FUJI ELECTRIC DEVICE TECHNOLOGY CO LTD 发明人 KUMAGAI NAOKI;HARADA YUICHI;JINBO SHINICHI;IKURA YOSHIHIRO;YOSHIDA KAZUHIKO;FUJIHIRA TATSUHIKO
分类号 H01L29/78;H01L29/786 主分类号 H01L29/78
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