发明名称 Exposure Method, Exposure Apparatus, Method for Producing Device, and Method for Evaluating Exposure Apparatus
摘要 An exposure method includes a first step for measuring position information of a substrate while controlling a substrate stage to move the substrate stage in a state that an optical path space is filled with a liquid under a predetermined condition; a second step for obtaining a movement control accuracy of the substrate stage based on a result of the measurement; a third step for determining an exposure condition, for exposing the substrate, based on the obtained movement control accuracy; and a fourth step for exposing the substrate based on the determined exposure condition. This makes it possible to satisfactorily expose the substrate at the time of exposing the substrate based on the liquid immersion method.
申请公布号 US2008212056(A1) 申请公布日期 2008.09.04
申请号 US20060886506 申请日期 2006.03.17
申请人 NIKON CORPORATION 发明人 SHIRAISHI KENICHI
分类号 G03B27/42;G03F7/00 主分类号 G03B27/42
代理机构 代理人
主权项
地址