| 摘要 |
Circuit testing equipment comprising a computer ( 110 ) having stored thereon a boundary scan description language (BSDL) file ( 111 ), a netlist ( 112 ) and a connections list ( 113 ). A connector ( 112 ) connects the computer to a boundary scan bus of a circuit ( 120 ) to be tested. The computer is arranged to parse and compile the BSDL file, the netlist and the connections list to generate a data structure which, when combined with a test script ( 114 ), permits execution of the test script from the computer through the boundary scan bus. The test script can be IC-specific such that it is valid for a particular IC independent of the circuit in which the IC is located.
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