发明名称 |
MULTILAYER CERAMIC ELECTRONIC DEVICE |
摘要 |
A highly reliable multilayer ceramic electronic device is obtained while preventing crack defects generated in a ceramic laminate by application of a heat shock in a mounting step or the like. The multilayer ceramic electronic device is constructed such that the average value of continuities of internal electrodes located in two regions (f) is lower by 5% to 20% inclusive than the average value of continuities of internal electrodes located in the central portion in a lamination direction. The two regions (f) are the regions from the topmost internal electrode and the bottommost internal electrode located in the lamination direction to the inside, respectively, within 10% of the distance (d) therebetween. Continuity is defined by (X-Y)/X in which X is the length of a cross section of an internal electrode in one direction and Y indicates the sum of gaps (g) formed by pores in the cross section of the internal electrode.
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申请公布号 |
US2008212257(A1) |
申请公布日期 |
2008.09.04 |
申请号 |
US20070931667 |
申请日期 |
2007.10.31 |
申请人 |
MURATA MANUFACTURING CO., LTD. |
发明人 |
SAKAMOTO NORIHIKO;ABE TOMORO |
分类号 |
H01G4/008;H01G4/005;H01G4/12;H01G7/00 |
主分类号 |
H01G4/008 |
代理机构 |
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地址 |
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