发明名称 Susceptor with surface roughness for high temperature substrate processing
摘要 <p>Susceptors plates are formed having a minimum surface roughness. The wafer contact surfaces of the susceptor plates have a surface roughness Ra value of about 0.6 µm or more. The contact surface is otherwise flat and lacking in large protrusions. In addition, the susceptors have a low transparency to more closely match the heat absorption properties of the supported wafer. Advantageously, heat transfer from the susceptors to the wafers is highly uniform. Thus, using these susceptors to support the wafers during high temperature semiconductor processing (e.g., at &gt; 1000°C) results in no or few crystallographic slip lines being formed on the wafers.</p>
申请公布号 EP1965412(A1) 申请公布日期 2008.09.03
申请号 EP20080009872 申请日期 2005.09.03
申请人 ASM INTERNATIONAL N.V. 发明人 GRANNEMAN, ERNST H.A.;VAN DEN BERG, JANNES REMCO
分类号 H01L21/00 主分类号 H01L21/00
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