发明名称 OPERATING METHOD OF CHARGE TRAP FLASH MEMORY DEVICE
摘要 An operation method of a charge trap flash memory device is provided to prevent opposite charges from being left in a charge trap layer in a program state or an erase state, by improving recombination speed of electrons and holes and stabilizing charges. According to an operation method of performing program or erase operation in a charge trap flash memory device having a charge trap layer, the program or erase operation is performed by applying a composite pulse of a DC pulse and a perturbation pulse to the charge trap flash memory device. The perturbation pulse is an AC perturbation pulse. The composite pulse has the AC perturbation pulse following the DC pulse. According to the composite pulse, the DC pulse has an equal polarity to the AC perturbation pulse, and the AC perturbation pulse has a DC level overlapped with the DC pulse.
申请公布号 KR20080079972(A) 申请公布日期 2008.09.02
申请号 KR20070037166 申请日期 2007.04.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SEOL, KWANG SOO;PARK, SANG JIN;LEE, SUNG HOON;PARK, SUNG IL;KIM, JONG SEOB
分类号 G11C16/10;G11C16/14;G11C16/32 主分类号 G11C16/10
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