发明名称 Shallow trench isolation in floating gate devices
摘要 The present invention provides a method for manufacturing a floating gate type semiconductor device on a substrate having a surface ( 2 ), and a device thus manufactured. The method comprises:-forming, on the substrate surface, a stack comprising an insulating film ( 4 ), a first layer of floating gate material ( 6 ) and a layer of sacrificial material ( 8 ),-forming at least one isolation zone ( 18 ) through the stack and into the substrate ( 2 ), the first layer of floating gate material ( 6 ) thereby having a top surface and side walls ( 26 ),-removing the sacrificial material ( 8 ), thus leaving a cavity ( 20 ) defined by the isolation zones ( 18 ) and the top surface of the first layer of floating gate material ( 6 ), and filling the cavity ( 20 ) with a second layer of floating gate material ( 22 ), the first layer of floating gate material ( 6 ) and the second layer of floating gate material ( 22 ) thus forming together a floating-gate ( 24 ).
申请公布号 US7419875(B2) 申请公布日期 2008.09.02
申请号 US20050537518 申请日期 2005.06.03
申请人 NXP B.V. 发明人 VAN SCHAIJK ROBERTUS THEODORUS FRANSISCUS;VAN DUUREN MICHIEL JOS
分类号 H01L21/336;H01L21/8247;H01L27/115 主分类号 H01L21/336
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