发明名称 Semiconductor integrated circuit and leak current reducing method
摘要 The present invention provides a semiconductor integrated circuit device which includes at least an SRAM memory cell array comprising a plurality of memory cells each constituted of a circuit including load MOS transistors, drive MOS transistors and transfer MOS transistors, a substrate bias generating circuit which is electrically connected to the load MOS transistors and supplies a substrate potential to the load MOS transistors during at least operation and standby, and a source bias generating circuit which is electrically connected to the drive MOS transistors and supplies a source potential to the drive MOS transistors at standby. It is possible to reduce a leak current in an SRAM memory cell during both operation and standby and reduce current consumption.
申请公布号 US7420857(B2) 申请公布日期 2008.09.02
申请号 US20060546955 申请日期 2006.10.13
申请人 OKI ELECTRIC INDUSTRY CO., LTD. 发明人 HIROTA MAKOTO;KIKUCHI HIDEKAZU
分类号 G11C11/34 主分类号 G11C11/34
代理机构 代理人
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