发明名称 Semiconductor device having a fin structure and method of manufacturing the same
摘要 A semiconductor device may include a fin structure having source/drain regions and channel fins connected between source/drain patterns. A gate insulation layer may be provided on the channel fins. A gate electrode may include lower gate patterns and an upper gate pattern. The lower gate patterns may extend in a vertical direction and contact the gate insulation layer. The upper gate pattern may extend in a second horizontal direction substantially perpendicular to the first horizontal direction. The upper gate pattern may be connected to upper portions of the lower gate patterns.
申请公布号 US7420244(B2) 申请公布日期 2008.09.02
申请号 US20050183995 申请日期 2005.07.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YOON JAE-MAN;LEE CHOONG-HO;LEE CHUL;PARK DONG-GUN
分类号 H01L29/76;H01L29/94 主分类号 H01L29/76
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