Semi-conductor component test device, in particular data buffer component with semi-conductor component test device, as well as semi-conductor component test procedure

摘要

The invention relates to a semi-conductor component test procedure, and a semiconductor component test device ( 10 b), which comprise: a device ( 43 ) for generating pseudo-random address values to be applied to corresponding address inputs of a semi-conductor component ( 2 b), in particular a memory component, to be tested.