发明名称 Semiconductor-circuit-device verifying method and CAD apparatus for implementing the same
摘要 A verifying method and apparatus verifies operation of a semiconductor circuit device by inputting, to a logical simulator, logical models representing a logic circuit and an analog circuit, adding, to the logical model representing the analog circuit, a function that generates a function value in accordance with the state of connections between terminals of the analog circuit and terminals of the logic circuit, outputting the result of comparing the function value generated by the function and an expected value, and, based on a result of the comparison, determining whether or not there is a connection error between the terminals of the analog circuit and the terminals of the logic circuit.
申请公布号 US7420489(B2) 申请公布日期 2008.09.02
申请号 US20060407950 申请日期 2006.04.21
申请人 FUJITSU LIMITED 发明人 WATANABE HITOSHI
分类号 H03M1/10 主分类号 H03M1/10
代理机构 代理人
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