Method and apparatus for embedded built-in self-test (bist) of electronic circuits and systems,申请号HK20050101723-传众专利搜索

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法人/股东/高管

发明名称	Method and apparatus for embedded built-in self-test (bist) of electronic circuits and systems
摘要
申请公布号	HK1069207(A1)	申请公布日期	2008.08.29
申请号	HK20050101723	申请日期	2005.03.01
申请人	INTELLITECH CORPORATION	发明人	RICCHETTI MICHAEL;CLARK CHRISTOPHER
分类号	G01R;G01R31/3185	主分类号	G01R
代理机构		代理人
主权项
地址

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