发明名称 |
METHOD OF FORMING SEMICONDUCTOR DEVICE HAVING OFFSET SPACER AND RELATED DEVICE |
摘要 |
<p>A method of manufacturing a semiconductor device with an offset spacer and a related device are provided to form an offset spacer while preventing occurrence of a recess of a semiconductor substrate and to implement a semiconductor device with excellent electric characteristics. A method of manufacturing a semiconductor device includes the steps: forming a gate electrode(57) on a semiconductor substrate(51); forming a re-oxidation layer on a upper surface and sidewalls of the gate electrode using a thermal oxidation process; forming an etch stop layer on the entire surface of the semiconductor substrate having the gate electrode; forming first spacers on sidewalls of the gate electrode so that the etch stop layer is exposed on the semiconductor substrate of both sides of the gate electrode; forming LDD regions(73) on the semiconductor substrate using the gate electrode and the first spacers as ion injection mask; and forming second spacers(74) on the first spacers.</p> |
申请公布号 |
KR20080079052(A) |
申请公布日期 |
2008.08.29 |
申请号 |
KR20070019089 |
申请日期 |
2007.02.26 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KANG, SUNG GUN |
分类号 |
H01L29/78;H01L21/336 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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