发明名称 METHOD OF FORMING SEMICONDUCTOR DEVICE HAVING OFFSET SPACER AND RELATED DEVICE
摘要 <p>A method of manufacturing a semiconductor device with an offset spacer and a related device are provided to form an offset spacer while preventing occurrence of a recess of a semiconductor substrate and to implement a semiconductor device with excellent electric characteristics. A method of manufacturing a semiconductor device includes the steps: forming a gate electrode(57) on a semiconductor substrate(51); forming a re-oxidation layer on a upper surface and sidewalls of the gate electrode using a thermal oxidation process; forming an etch stop layer on the entire surface of the semiconductor substrate having the gate electrode; forming first spacers on sidewalls of the gate electrode so that the etch stop layer is exposed on the semiconductor substrate of both sides of the gate electrode; forming LDD regions(73) on the semiconductor substrate using the gate electrode and the first spacers as ion injection mask; and forming second spacers(74) on the first spacers.</p>
申请公布号 KR20080079052(A) 申请公布日期 2008.08.29
申请号 KR20070019089 申请日期 2007.02.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG, SUNG GUN
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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