| 摘要 |
A defect measurement device for display devices and a method thereof are provided to detect a defect precisely and rapidly by photographing an image for a display device having a regular period, shifting the photographed image by one regular period, comparing it with a copy image, and measuring a defective area through exclusive disjunction. A defect measurement device comprises a microscope(4), a regular period detection part(6), a copy image creation part(8), an image processing part(10), and a display part(12). The microscope photographs an LCD(Liquid Crystal Display)(2). The regular period detection part detects a regular period from the photographed image. The copy image creation part shifts the photographed image by the detected regular period and creates a copy image. The image processing part compares the photographed image with the copy image and detects an unlike portion through exclusive disjunction. The display part displays the output of the image processing part. |
