发明名称 |
DETECTOR OF ABNORMAL DESTRUCTION OF MEMORY SECTORS |
摘要 |
The invention relates to an integrated circuit comprising at least one microprocessor [12] linked to at least one non-volatile memory [14] that can be accessed by sectors. The integrated circuit comprises a detector [20] for discovering when a threshold number of bad sectors has been exceeded in said non-volatile memory [14]. |
申请公布号 |
EP1961012(A1) |
申请公布日期 |
2008.08.27 |
申请号 |
EP20060841333 |
申请日期 |
2006.12.12 |
申请人 |
GEMPLUS |
发明人 |
FEYT, Nathalie;ARNOUX, Christophe |
分类号 |
G11C16/34 |
主分类号 |
G11C16/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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