| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device (chip) which assures uniform operating characteristics of transistors with reduced overhead. SOLUTION: A semiconductor device, wherein a chip 1 is divided into many blocks B1 and B2, includes an overall settings circuit 11 to set information on variation in the transistor characteristics for each chip, many area circuits 12 which are provided on each block to control the substrate bias potential on each block, and a transmission path 13 for transmitting the information on variation in the transistor characteristics from the overall setting circuit to each area circuit. Each of the area circuits 12 has block substrate voltage generator circuits 25, 27 to output the substrate bias potential on each block, and area measurement circuits 21, 22, 23 which measure variation factors affecting the operating characteristics of transistors on each block, while controlling the substrate bias potential values in accordance with measured variation factors and transmitted information on variation in the transistor characteristics. COPYRIGHT: (C)2008,JPO&INPIT
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