发明名称 ADDRESS TRANSITION DETECTOR FOR FAST FLASH MEMORY DEVICE
摘要 <p>An address transition detector circuit includes an input node, an output node, a bandgap reference node, and P<SUB>bias </SUB>and N<SUB>bias </SUB>nodes having voltages derived from the bandgap reference node. First through fifth cascaded inverters are each powered by a p-channel and n-channel MOS bias transistors having their gates coupled respectively to the P<SUB>bias </SUB>node and the N<SUB>bias </SUB>node. The input of the first inverter is coupled to the input node. First and second capacitors are coupled respectively to ground from the outputs of the first and fourth cascaded inverters. A NAND gate has a first input coupled to the input node, a second input coupled the output of the fifth cascaded inverter, and an output coupled to the output node.</p>
申请公布号 EP1961119(A2) 申请公布日期 2008.08.27
申请号 EP20060840301 申请日期 2006.12.18
申请人 ACTEL CORPORATION 发明人 LEE, POONGYEUB;LIU, MING-CHI
分类号 H03K19/0175;G11C7/06 主分类号 H03K19/0175
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