SEMICONDUCTOR MEMORY TEST DEVICE AND MEHTOD OF TESTING A SEMICONDUCTOR MEMORY DEVICE

摘要

A method and an apparatus for testing a semiconductor memory device are provided to test various semiconductor memory devices using the same test apparatus by detecting a kind of a DUT. A host interface unit(210) detects DUTs, which are connected to a memory test board through a socket. A configuration information unit(230) stores memory configuration information for the DUTs. A configuring unit(220) reads the memory configuration information corresponding to the detected DUT and outputs test parameters required for testing the DUT(Device Under Test) based on the memory configuration information. A test unit(240) provides a test pattern to the DUT according to the test parameters, reads the test pattern stored in the test memory device according to the test parameter, and compares the read test pattern with the test pattern.