| 摘要 |
A method and a system-on-chip driving a multi-phase scan chain are provided to suppress a failure in a scan chain vector by preventing a voltage drop in the scan chain. A system-on-chip driving a multi-phase scan chain includes functional blocks(10,20) and plural scan chains(11,13,21,23). The scan chains are provided in the respective functional blocks and synchronized with plural clocks respectively, and perform scan tests on the functional blocks. The clocks have different phases. Each of the scan chains tests an inner combinational circuit in the functional block during an isolation mode. During an interface mode, the combination circuit between adjacent functional blocks is tested by the scan chains, which are included in the respective adjacent functional blocks.
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