发明名称 Semiconductor device including interlayer interconnecting structures and methods of forming the same
摘要 In a method of forming a semiconductor device, and a semiconductor device formed according to the method, an insulating layer is provided on an underlying contact region of the semiconductor device. An opening is formed in the insulating layer to expose the underlying contact region. A seed layer is provided on sidewalls and a bottom of the opening, the seed layer comprising cobalt. A barrier layer of conductive material is provided in a lower portion of the opening, the seed layer being exposed on sidewalls of an upper portion of the opening. A metal layer is provided on the barrier layer in the opening to form an interlayer contact, the metal layer contacting the seed layer at the sidewalls of the upper portion of the opening.
申请公布号 US2009026618(A1) 申请公布日期 2009.01.29
申请号 US20080220527 申请日期 2008.07.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM HYUN-SU;KIM DAEYONG;LEE EUN-OK;KIM BYUNGHEE;LEE JANG-HEE;JUNG EUN-JI;CHOI GILHEYUN
分类号 H01L21/768;H01L23/48 主分类号 H01L21/768
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