发明名称 |
Method of forming a high-frequency transistor gate electrode |
摘要 |
A method of forming a T-type gate electrode of a high-frequency transistor having excellent high-frequency power transfer characteristic with no concave and protrusion, which comprises the steps of: forming a first resist pattern (3) having a first relatively narrow opening (2) on a semiconductor substrate (1) and forming a leg portion (61) of an electrode in the first opening by depositing electrode metal thereon; forming a second resist pattern (5) having a second relatively wide opening (4) on the electrode leg portion for locating an exposed tip of the electrode leg portion in the bottom of the second opening and forming a head portion (62) of the electrode by depositing electrode metal in the second opening; and removing a protrusion (11) formed in the head portion by etching. |
申请公布号 |
EP0724288(B1) |
申请公布日期 |
2009.03.04 |
申请号 |
EP19960101083 |
申请日期 |
1996.01.25 |
申请人 |
HONDA GIKEN KOGYO KABUSHIKI KAISHA |
发明人 |
KAMIYAMA, TOMOYUKI;ISHIKAWA, YAMATO |
分类号 |
H01L21/338;H01L29/41;H01L21/027;H01L21/28;H01L21/285;H01L21/3105;H01L29/417;H01L29/812 |
主分类号 |
H01L21/338 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|