发明名称 Method of forming a high-frequency transistor gate electrode
摘要 A method of forming a T-type gate electrode of a high-frequency transistor having excellent high-frequency power transfer characteristic with no concave and protrusion, which comprises the steps of: forming a first resist pattern (3) having a first relatively narrow opening (2) on a semiconductor substrate (1) and forming a leg portion (61) of an electrode in the first opening by depositing electrode metal thereon; forming a second resist pattern (5) having a second relatively wide opening (4) on the electrode leg portion for locating an exposed tip of the electrode leg portion in the bottom of the second opening and forming a head portion (62) of the electrode by depositing electrode metal in the second opening; and removing a protrusion (11) formed in the head portion by etching.
申请公布号 EP0724288(B1) 申请公布日期 2009.03.04
申请号 EP19960101083 申请日期 1996.01.25
申请人 HONDA GIKEN KOGYO KABUSHIKI KAISHA 发明人 KAMIYAMA, TOMOYUKI;ISHIKAWA, YAMATO
分类号 H01L21/338;H01L29/41;H01L21/027;H01L21/28;H01L21/285;H01L21/3105;H01L29/417;H01L29/812 主分类号 H01L21/338
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