发明名称 APPARATUS AND METHOD FOR MEASURING JITTER, APPARATUS AND METHOD FOR MEASURING SIGNAL PERIOD, AND OPTICAL DISC REPRODUCING APPARATUS
摘要 An apparatus and a method for measuring jitters, an apparatus and a method for measuring a signal period, and an optical disk reproducing apparatus are provided to improve signal quality by measuring an accurate jitter value of the input signal using a binary signal and an abnormal signal which is generated by filtering the binary signal. An apparatus for measuring jitters comprises a binarization part(310), an abnormal signal generating part(320), and a jitter measuring part(330). The binarization part converts an input signal into binary form. The abnormal signal generating part receives the binary signal and generates the abnormal signal without noise based on the channel features of an optical disk. The jitter measuring part measures the jitter value of the input signal based on the binary signal and the abnormal signal. The abnormal signal generating part generates the abnormal signal by filtering the binary signal.
申请公布号 KR20080078499(A) 申请公布日期 2008.08.27
申请号 KR20070021148 申请日期 2007.03.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HWANG, WOOK YEON;PARK, HYUN SOO;HWANG, IN OH;LEE, KYUNG GEUN
分类号 G11B7/09;G11B7/00;G11B20/10;G11B20/18 主分类号 G11B7/09
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