发明名称 Micropattern measuring method, micropattern measuring apparatus, and computer-readable recording medium on which a micropattern measuring program is recorded
摘要 A micropattern measuring method disclosed herein includes acquiring an image of a micropattern including plural layers; extracting a rough outline of the micropattern in the image as a sequence of points including plural points; dividing the plural points composing the sequence of points into groups; making each of the groups as each of patterns belong to any of the plural layers; and acquiring edge coordinates of a pattern to be measured from the patterns which are made to belong to the respective layers.
申请公布号 US7418363(B2) 申请公布日期 2008.08.26
申请号 US20050180609 申请日期 2005.07.14
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 IKEDA TAKAHIRO;MIYANO YUMIKO
分类号 G01B5/02;G01B15/00;G01B5/14;G01B7/02;G01B7/14;G01B11/02;G01B11/14;G01B13/02;G01B21/02;G06F15/00;G06K9/00;G06T7/00;G06T7/40;G06T7/60;H01L21/66 主分类号 G01B5/02
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