发明名称 |
Micropattern measuring method, micropattern measuring apparatus, and computer-readable recording medium on which a micropattern measuring program is recorded |
摘要 |
A micropattern measuring method disclosed herein includes acquiring an image of a micropattern including plural layers; extracting a rough outline of the micropattern in the image as a sequence of points including plural points; dividing the plural points composing the sequence of points into groups; making each of the groups as each of patterns belong to any of the plural layers; and acquiring edge coordinates of a pattern to be measured from the patterns which are made to belong to the respective layers.
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申请公布号 |
US7418363(B2) |
申请公布日期 |
2008.08.26 |
申请号 |
US20050180609 |
申请日期 |
2005.07.14 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
IKEDA TAKAHIRO;MIYANO YUMIKO |
分类号 |
G01B5/02;G01B15/00;G01B5/14;G01B7/02;G01B7/14;G01B11/02;G01B11/14;G01B13/02;G01B21/02;G06F15/00;G06K9/00;G06T7/00;G06T7/40;G06T7/60;H01L21/66 |
主分类号 |
G01B5/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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