发明名称 Thin film resistors integrated at two different metal interconnect levels of single die
摘要 An integrated circuit includes a first thin film resistor on a first dielectric layer. A first layer of interconnect conductors on the first dielectric layer includes a first and second interconnect conductors electrically contacting the first thin film resistor. A second dielectric layer is formed on the first dielectric layer. A second thin film resistor is formed on the second dielectric layer. A third dielectric layer is formed on the second dielectric layer. A second layer of interconnect conductors on the third dielectric layer includes a third interconnect conductor extending through an opening in the second and third dielectric layers to contact the first interconnect conductor, a fourth interconnect conductor extending through an opening in the second and third dielectric layers to contact the second interconnect conductor, and two interconnect conductors extending through openings in the third dielectric layer of the second thin film resistor. A fifth interconnect conductor extends through an opening in the first dielectric layer to contact a circuit element.
申请公布号 US7416951(B2) 申请公布日期 2008.08.26
申请号 US20050238715 申请日期 2005.09.29
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 BEACH ERIC W.;DROBNY VLADIMIR F.;ROBINSON DEREK W.
分类号 H01L21/8222 主分类号 H01L21/8222
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