发明名称 Diagnostic analytical system comprising DNA chips with thin-film transistor (TFT) elements
摘要 An IJ-system reagent inspection device 3 that instructs an ejection device to eject a reagent and reads an inspection result from a detachable DNA chip module 2. The method is carried out based on inspection information of inputted inspection items to produce and output inspection data along with inputted examinee-identification information and the corresponding inspection items through communication lines. In a control device 5 , the examinee identification information is received from the IJ-system reagent inspection device 3 along with the inspection items and the inspection data through the communication lines. The inspection items and the inspection data are recorded in association with the examinee identification information to request a diagnosis based on the inspection data.
申请公布号 US7416841(B2) 申请公布日期 2008.08.26
申请号 US20030635213 申请日期 2003.08.06
申请人 SEIKO EPSON CORPORATION 发明人 ARUGA HISASHI;SHIMODA TATSUYA
分类号 C12Q1/68;G01N33/53;A61B5/00;A61B10/00;C12M1/34;C12M1/40;G01N33/00;G01N33/543;G01N33/566;G06F17/40;H04L29/02 主分类号 C12Q1/68
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