发明名称 Methods of manufacturing microelectronic imaging units with discrete standoffs
摘要 Microelectronic imaging units and methods for manufacturing microelectronic imaging units are disclosed herein. In one embodiment, a method includes placing a plurality of singulated imaging dies on a support member. The individual imaging dies include an image sensor, an integrated circuit operably coupled to the image sensor, and a plurality of external contacts operably coupled to the integrated circuit. The method further includes disposing a plurality of discrete stand-offs on the support member. The discrete stand-offs are arranged in arrays relative to corresponding imaging dies. The method further includes electrically connecting the external contacts of the imaging dies to corresponding terminals on the support member, and attaching a plurality of covers to corresponding stand-off arrays so that the covers are positioned over the image sensors.
申请公布号 US7416913(B2) 申请公布日期 2008.08.26
申请号 US20040893022 申请日期 2004.07.16
申请人 MICRON TECHNOLOGY, INC. 发明人 HALL FRANK L.;REEDER WILLIAM J.;STREET BRET K.;DERDERIAN JAMES M.
分类号 H01L21/00 主分类号 H01L21/00
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