发明名称 PHASE CHANGE MEMORY
摘要 <P>PROBLEM TO BE SOLVED: To provide a phase change memory element exhibiting an excellent temperature uniformity, the manufacture process of which is comparatively simple, capable of adapting to various cell designs, and the cost of which can be kept at low. <P>SOLUTION: A phase change memory element 200 includes a first electrode 101 and a second electrode 106 including a phase change material, and a metal layer 103 of embedded type with a phase change layer formed between the first electrode 101 and the second element 106 and electrically connected to the first electrode and the second electrode, and further including a conductive path in which a current flows through the metal layer of embedded type with the phase change layer when a bias voltage is supplied to the phase change memory element. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008193071(A) 申请公布日期 2008.08.21
申请号 JP20080006653 申请日期 2008.01.16
申请人 IND TECHNOL RES INST;POWERCHIP SEMICONDUCTOR CORP;NANYA SCI & TECHNOL CO LTD;PROMOS TECHNOL INC;HUABANG ELECTRONIC CO LTD 发明人 CHUO YEN;CHIN TATSU
分类号 H01L27/105;H01L45/00 主分类号 H01L27/105
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