| 摘要 |
PROBLEM TO BE SOLVED: To provide a device test data display capable of selection-assigning visually computation desired to be executed, and capable of improving operability so as to execute it easily with reduced procedures. SOLUTION: This device test data display displays a plurality of data measured by an IC tester as a plurality of waveforms, computes the plurality of displayed waveforms to be displayed as another waveforms, and includes a computation expression display area for function-computing the plurality of waveforms. COPYRIGHT: (C)2008,JPO&INPIT
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