| 摘要 |
PROBLEM TO BE SOLVED: To provide an IC test device and an IC test method which can shorten a processing period of time by shortening intervals of function tests performing several times. SOLUTION: The test device is equipped with: a tester unit for performing a test of cells with respect to a plurality of devices to be tested; and a plurality of redundancy units 60 respectively including a fail memory 61, buffer memory 62, redundancy CPU 60. The tester unit performs the test of the device to be tested and stores fail data in the respective fail memories 61 of the plurality of redundancy units 60 through a main bus 55, and a redundancy CPU 63 copies the fail data from the fail memory 61 to the buffer memory 62 through a local bus 66 and performs a redundancy operation in accordance with the fail data stored in the buffer memory 62. COPYRIGHT: (C)2008,JPO&INPIT
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