发明名称 NONVOLATILE MEMORY DEVICES AND METHODS OF MANUFACTURING THE SAME
摘要 A method of manufacturing a nonvolatile memory device is provided. The method includes forming an isolation layer in a semiconductor substrate defining an active region and forming a molding pattern on the isolation layer. A first conductive layer is formed on a sidewall and a top surface of the molding pattern and on the semiconductor substrate. The first conductive layer on the top surface of the molding pattern is selectively removed forming a conductive pattern. The conductive pattern includes a body plate disposed on the active region and a protrusion which extends from an edge of the body plate onto the sidewall of the molding pattern. The molding pattern is then removed. An inter-gate dielectric layer is formed on the isolation layer and the conductive pattern. Nonvolatile memory devices manufactured using the method are also provided.
申请公布号 US2008197401(A1) 申请公布日期 2008.08.21
申请号 US20080026812 申请日期 2008.02.06
申请人 HONG EUN-MI;KIM KWANG-TAE;PARK JI-HOON 发明人 HONG EUN-MI;KIM KWANG-TAE;PARK JI-HOON
分类号 H01L27/105;H01L21/28 主分类号 H01L27/105
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