发明名称 Methods of forming semiconductor devices
摘要 A method of forming a semiconductor device includes: forming a pattern having trenches on a semiconductor substrate; forming a semiconductor layer on the semiconductor device that fills the trenches; planarizing the semiconductor layer using a first planarization process without exposing the pattern; performing an epitaxy growth process on the first planarized semiconductor layer to form a crystalline semiconductor layer; and planarizing the crystalline semiconductor layer until the pattern is exposed to form a crystalline semiconductor pattern.
申请公布号 US2008200007(A1) 申请公布日期 2008.08.21
申请号 US20080070220 申请日期 2008.02.15
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LIM JONG-HEUN;HONG CHANG-KI;YOON BO-UN;YUN SEONG-KYU;CHOI SUK-HUN;HAN SANG-YEOB
分类号 H01L21/762 主分类号 H01L21/762
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