| 摘要 |
PROBLEM TO BE SOLVED: To measure the three-dimensional shapes of objects in a short time by shortening operation time. SOLUTION: In a three-dimensional shape measuring apparatus, sinusoidal optical patterns are projected to an object 2 to photograph the object 2 to which the optical patterns are projected, and the three-dimensional shape of the object 2 is measured on the basis of its photographed images. The three-dimensional shape measuring apparatus is provided with a projector 3 for projecting a short-wavelength optical pattern 20 and a long-wavelength optical pattern 30 to the object 2; a camera 4 for photographing the object 2 to which the short-wavelength and long-wavelength optical patterns 20 and 30 are projected; a phase computing part 14 for computing the relative phase of the short-wavelength and long-wavelength optical patterns 20 and 30 on the basis of images acquired by the photographing of the camera 4; a previously created table 13a in which the relative phase of the short-wavelength and long-wavelength optical patterns 20 and 30 is recorded correspondingly to distance; and a distance deriving part 15 for making reference to the table 13a and determining the distance to the object 2 through the use of the relative phase of the short-wavelength and long-wavelength optical patterns 20 and 30 computed by the phase computing part 14. COPYRIGHT: (C)2008,JPO&INPIT
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