发明名称 ABNORMALITY DETECTION APPARATUS AND ABNORMALITY DETECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide an abnormality detection apparatus capable of detecting an abnormal state different from a normal state from any multidimensional characteristic data with high accuracy. SOLUTION: The abnormality detection apparatus includes: a means for extracting multidimensional characteristic data; a means for calculating an angle between a normal partial space acquired beforehand by principal component analysis and the characteristic data; a first abnormality determination means for determining an abnormal state when the angle is larger than a predetermined value; a means for projecting characteristic data that is not determined as an abnormality by the first abnormality determination means to the normal partial space; and a second abnormality determination means for determining whether the characteristic data projected by the means for projecting is within a distribution range of a preliminarily acquired normal sample. The accuracy of abnormality determination improves because abnormality determination is made possible even for an event that has been conventionally determined to be normal in spite that the event is abnormal. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008191754(A) 申请公布日期 2008.08.21
申请号 JP20070022947 申请日期 2007.02.01
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY 发明人 KOBAYASHI TAKUMI;OTSU NOBUYUKI
分类号 G06T7/00;H04N7/18 主分类号 G06T7/00
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