发明名称 |
MANUFACTURING METHOD OF NONVOLATILE MEMORY DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a manufacturing method of a nonvolatile memory device in which charge diffusion to a side of a charge trapping film is prevented. SOLUTION: A tunnel insulating film 102, a charge trapping film 104, a blocking film 106 and an electrically conductive film 108 are formed in sequence on a substrate 100 having a channel region. A word line structure 124 is formed by patterning the electrically conductive film 108, and a blocking film pattern 126 and a charge trapping film pattern 128 are formed by etching the blocking film 106 and the charge trapping film 104 respectively using an acidic solution as an etchant. COPYRIGHT: (C)2008,JPO&INPIT
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申请公布号 |
JP2008193081(A) |
申请公布日期 |
2008.08.21 |
申请号 |
JP20080017796 |
申请日期 |
2008.01.29 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
SHIM WOO-GWAN;LEE MONG-SUP;CHA JI-HOON;HONG CHANGKI;RI KONTAKU |
分类号 |
H01L21/8247;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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