发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method which allows a structure formed of a low-melting material to be used, enables a space where the structure is sealed to turn into high vacuum, and avoids film formation of a sealing member on the structure. SOLUTION: According to the semiconductor device manufacturing method, the movable structure 3 formed on a semiconductor substrate 1 is covered with a sacrifice film which is then covered with a silicon dioxide film 5, and a through hole is formed in the silicon dioxide film 5. Then the sacrifice film is removed via the through hole to secure a space between the movable structure 3 and the silicon dioxide film 5, and the through hole is sealed by forming by sputtering a film of aluminum or aluminum alloy, having high fluidity on the silicon dioxide film 5. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008188711(A) 申请公布日期 2008.08.21
申请号 JP20070026045 申请日期 2007.02.05
申请人 OKI ELECTRIC IND CO LTD 发明人 NAKAMURA MAKIKO
分类号 B81C1/00;C23C14/14;H01L21/306 主分类号 B81C1/00
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