| 摘要 |
PROBLEM TO BE SOLVED: To accurately measure stress and strain under ununiform condition generated when deforming a polycrystal material or a composite material. SOLUTION: This tension testing device is attached to an inside of a scanning electron microscope mounted with a reflected electron detector, a test piece is tensioned while photographing a reflected electron image, and a change of a shape in a crystal grain appearing in the reflected electron image is measured to compute sequentially a strain amount in each crystal grain and a cross section with respect to a tensioned direction. COPYRIGHT: (C)2008,JPO&INPIT
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