发明名称 TEMPERATURE DETECTION CIRCUIT
摘要 A temperature detection circuit is provided to prevent the malfunction by selectively shorting an output terminal and a positive power terminal based on an output voltage of a temperature sensor circuit and a reference voltage of a reference voltage circuit. A temperature detection circuit comprises a temperature sensor circuit(200), a reference voltage circuit(300) outputting a reference voltage, a comparator(400), and a malfunction prevention circuit(100) connected to an output terminal(700) of the comparator. The temperature sensor outputs variable voltage depending on the temperature. The comparator compares the output voltage of the temperature sensor circuit with the reference voltage to output signal which inverses on a predetermined temperature. Right after power is turned on, the output terminal is set to have a predetermined voltage by malfunction prevention circuit.
申请公布号 KR20080077050(A) 申请公布日期 2008.08.21
申请号 KR20080013955 申请日期 2008.02.15
申请人 SEIKO INSTRUMENTS INC. 发明人 IGARASHI ATSUSHI
分类号 G01K7/00;G01K7/16;G01K7/20 主分类号 G01K7/00
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