发明名称 |
METHOD AND MEASURING SYSTEM FOR MEASURING A PHYSICAL QUANTITY |
摘要 |
The invention relates to a method for measuring a physical quantity by means of a measuring system comprising a measuring sensor, a signal source and a computation unit, wherein the computation unit has a reference signal input, a measurement signal input and a signal output and generates an amplified difference between a measurement signal and a reference signal as output signal. In the method, a reference signal is applied both to the reference signal input and to the measurement signal input of the computation unit, an offset error of the measuring system is determined from the resultant output signal of the computation unit, an attenuated reference signal is applied to the reference signal input and the reference signal is applied to the measurement signal input and an actual gain quantity is determined by the difference between the then resultant output signal of the computation unit and the previously calculated offset error, then the reference signal is applied to the reference signal input and a measurement signal is applied to the measurement signal input and a corrected output signal is determined by forming the difference between the resultant output signal of the computation unit and the offset error and the actual gain quantity is compared with a predetermined desired gain quantity and a total gain of the measuring system is reduced if the actual gain quantity is greater than the desired gain quantity, or increased if the desired gain quantity is greater than the actual gain quantity. The invention furthermore relates to a measuring system for carrying out such a method. |
申请公布号 |
WO2008052377(A3) |
申请公布日期 |
2008.08.21 |
申请号 |
WO2007CH00534 |
申请日期 |
2007.10.29 |
申请人 |
HSR HOCHSCHULE FUER TECHNIK RAPPERSWIL;KAMM, LARS;HINN, WERNER;BAUMANN, ROMAN |
发明人 |
KAMM, LARS;HINN, WERNER;BAUMANN, ROMAN |
分类号 |
G01D3/036;G01D18/00 |
主分类号 |
G01D3/036 |
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