发明名称 DOUBLE GATE TRANSISTOR, METHOD FOR MANUFACTURING THE SAME, AND ACTIVE MATRIX SUBSTRATE COMPRISING DOUBLE GATE TRANSISTOR
摘要 <p>Disclosed is a method for manufacturing a double gate transistor (100), which comprises a step for forming a bottom gate electrode (110), a step for forming a first gate insulating film (120) covering the bottom gate electrode (110), a step for forming a semiconductor layer facing the bottom gate electrode (110) through the first gate insulating film (120), a step for obtaining a crystalline semiconductor layer (130) by irradiating the semiconductor layer with a laser beam, a step for forming a second gate insulating film (140) covering the crystalline semiconductor layer (130), and a step for forming a top gate electrode (150) facing the crystalline semiconductor layer (130) through the second gate insulating film (140). The bottom gate electrode (110) has a surface composed of a conductive metal oxide.</p>
申请公布号 WO2008099700(A1) 申请公布日期 2008.08.21
申请号 WO2008JP51757 申请日期 2008.02.04
申请人 SHARP KABUSHIKI KAISHA;KITAKADO, HIDEHITO 发明人 KITAKADO, HIDEHITO
分类号 H01L21/336;G02F1/1368;H01L21/20;H01L29/786 主分类号 H01L21/336
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