发明名称 CONTACT PROBE
摘要 PROBLEM TO BE SOLVED: To prevent breakage of a contact end of an electrode and damages to an object body to be probed. SOLUTION: The contact probe comprises an abutting part 5a disposed so as to allow relative movement to a base part 2a in the probing direction; a center electrode 4a and an outer electrode 3a, disposed so as to allow movement relative with respect to the base part 2a in the probing direction, independently of the abutting part 5a and that are mutually insulated; springs 6a and 8a that energizes the base part 2a and the abutting part 8a in the direction opposite to the probing direction; the spring 6a that energizes the base part 2a and the outer electrode 3a in the direction opposite to the probing direction; and a spring 7a that energizes the center electrode 4a and the outer electrode 3a in the direction opposite to the probing direction, wherein, an abutting end of the abutting part protrudes farther forward than contact ends of the center electrode 4a and the outer electrode 3a in the probing direction in a non-probing state. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008191081(A) 申请公布日期 2008.08.21
申请号 JP20070027925 申请日期 2007.02.07
申请人 HIOKI EE CORP;UNIV OF TOKYO 发明人 TOMOI TADASHI;HAMAGUCHI TETSUYA;KASAI TOMOSHI
分类号 G01R1/067 主分类号 G01R1/067
代理机构 代理人
主权项
地址