发明名称 STACKED SEMICONDUCTOR DEVICE AND METHOD OF FABRICATION
摘要 A stacked semiconductor device comprises a lower transistor formed on a semiconductor substrate, a lower interlevel insulation film formed on the semiconductor substrate over the lower transistor, an upper transistor formed on the lower interlayer insulation film over the lower transistor, and an upper interlevel insulation film formed on the lower interlevel insulation film over the upper transistor. The stacked semiconductor device further comprises a contact plug connected between a drain or source region of the lower transistor and a source or drain region of the upper transistor, and an extension layer connected to a lateral face of the source or drain region of the upper transistor to enlarge an area of contact between the source or drain region of the upper transistor and a side of the contact plug.
申请公布号 US2008199991(A1) 申请公布日期 2008.08.21
申请号 US20080108591 申请日期 2008.04.24
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM HYUN-SU;CHOI GIL-HEYUN;YUN JONG-HO;JUNG SUG-WOO;JUNG EUN-JI
分类号 H01L21/84 主分类号 H01L21/84
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